• DocumentCode
    88077
  • Title

    Nanodiamond Vacuum Field Emission Integrated Differential Amplifier

  • Author

    Hsu, Shao-Hua ; Kang, Weng Poo ; Davidson, Jimmy L. ; Huang, Jin H. ; Kerns, David V., Jr.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    487
  • Lastpage
    493
  • Abstract
    The development of a novel vacuum differential amplifier (diff-amp) array employing vertically configured nanodiamond (ND) vacuum field emission transistors (ND-VFETs) on a single chip is presented. The diff-amp array is composed of a common ND emitter array integrated with partition gates and split anodes. An identical pair of ND-VFETs with well-matched field emission transistor characteristics was fabricated by using a dual-mask well-controlled microfabrication process, involving a mold-transfer self-aligned gate-emitter technique in conjunction with ND deposition into the micropatterned molds in the active layer of a silicon-on-insulator substrate followed by gate partitioning to form diff-amp array. The ND-VFETs show gate-controlled modulation of emission with distinct cutoff, linear, and saturation regions. Signal amplification characteristics of the ND-VFET diff-amp are presented. A large common-mode-rejection ratio (CMRR) of 54.6 dB was measured for the diff-amp. The variation of CMRR performance with transconductance was examined, and the results were found to agree with the equivalent circuit model analysis. The accomplishment of this basic circuit building block, consisting of an integrated diff-amp, demonstrates the feasibility of using vacuum integrated circuits for practical applications, including high-radiation and temperature-tolerant space electronics.
  • Keywords
    differential amplifiers; equivalent circuits; field emission; silicon-on-insulator; circuit building block; common-mode-rejection ratio; dual-mask well-controlled microfabrication process; equivalent circuit model analysis; gate-controlled modulation; high-radiation space electronics; micropatterned molds; mold-transfer self-aligned gate-emitter technique; nanodiamond vacuum field emission integrated differential amplifier; nanodiamond vacuum field emission transistors; silicon-on-insulator; single chip; temperature-tolerant space electronics; transconductance; vacuum differential amplifier array; well-matched field emission transistor; Anodes; Cathodes; Logic gates; Silicon; Substrates; Transistors; Differential amplifier (diff-amp); integrated circuits (ICs); nanodiamond (ND); transistor; vacuum field emission (VFE);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2228485
  • Filename
    6376155