Title :
A Comparison of Conventional Dose Rate and Low Dose Rate Co-60 Testing of Idt Static RAMS and FSC Multiplexers
Author :
Schiff, Daniel ; Bruun, Jorgen ; Montesalvo, Mary ; Wong, C.-C.D.
Author_Institution :
Assurance Technology Corporation 84 South Street Carlisle, Massachusetts 01741
Abstract :
IDT71681L70 4K×4 static rams and FSC54F251 multiplexers failed conventional Co-60 radiation testing before reaching a cumulative dose of 10 Krad (Si). At a significantly lower dose rate of 23 rad (Si)/Hr these devices accumulated more than 38 Krad (Si) before failing. The effects on radiation hardness of going to a satellite mission dose rate of 2.3 rad(Si)/Hr are discussed.
Keywords :
Electronic equipment testing; Laboratories; Legged locomotion; MOS devices; Multiplexing; Power capacitors; Satellites; Semiconductor device testing; Semiconductor devices; Strips;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334067
