Title :
SPM based storage
Author_Institution :
Adv. Res. Lab., Hitachi Ltd., Kokubunji, Japan
fDate :
5/1/1996 12:00:00 AM
Abstract :
The possibility of developing a scanning probe microscope (SPM) based storage system is discussed. The advantages of storage based on a scanning tunneling microscope (STM), an atomic force microscope (AFM), a magnetic force microscope (MFM) and a scanning near-field optical microscope (SNOM) are described in regard to recording bit size and readout speed. The AFM and SNOM based storages are expected to be used for future storages
Keywords :
digital storage; microscopy; scanning probe microscopy; SPM; atomic force microscope; bit size; data storage; magnetic force microscope; readout speed; recording; scanning near-field optical microscope; scanning probe microscope; scanning tunneling microscope; Atom optics; Atomic force microscopy; Head; Magnetic force microscopy; Magnetic recording; Memory; Optical microscopy; Optical recording; Scanning probe microscopy; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
