DocumentCode
88129
Title
Analysis of a Triangular Corrugated Coaxial Cavity for Megawatt-Class Gyrotron
Author
Singh, Sukwinder ; Kartikeyan, M.V.
Author_Institution
Dept. of Electron. & Commun. Eng., IIT Roorkee, Roorkee, India
Volume
62
Issue
7
fYear
2015
fDate
Jul-15
Firstpage
2333
Lastpage
2338
Abstract
Field analysis for coaxial cavity with triangular corrugations on the inner rod (insert) to be used for megawatt-class gyrotron has been done. Mathematical formulation for its dispersion relation, wall losses, and quality factor has been presented. Quality factor for open-ended triangular corrugated cavity has been computed by solving Vlasov´s equation. The advantage of the mentioned structure is that it offers higher number of slots to be accommodated, which reduces the wall losses in the insert without causing heating problems between the slots. Incorporating corrugations on the insert leads to significant changes in the field structure inside the cavity. The mode eigenvalue, wall losses, and quality factor for such a cavity have been found to be heavily dependant on radii ratio (C = R0/Ri). Quality factor of desired and competing modes can be controlled by integrating a tapered insert. A coaxial cavity design for 204 GHz, 2 MW with TE44,26 as a desired mode is given. Wall losses, quality factor, and coupling coefficient for desired and competing modes have been calculated.
Keywords
Q-factor; coaxial waveguides; dispersion relations; eigenvalues and eigenfunctions; gyrotrons; Vlasov´s equation; coupling coefficient; dispersion relation; field analysis; frequency 204 GHz; inner rod; megawatt-class gyrotron; mode eigenvalue; open-ended triangular corrugated cavity; power 2 MW; quality factor; radii ratio; tapered insert; triangular corrugated coaxial cavity; wall losses; Cavity resonators; Corrugated surfaces; Eigenvalues and eigenfunctions; Gyrotrons; Manganese; Q-factor; Surface impedance; Coaxial cavity gyrotron; diffractive quality factor; ohmic quality factor; surface impedance method (SIM); surface impedance method (SIM).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2434494
Filename
7117393
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