Title :
Single Event Upset Immune Integrated Circuits for Project Galileo
Author :
Giddings, Alfred E. ; Hewlett, Frank W. ; Treece, R.Keith ; Nichols, Donald K. ; Smith, Lawrence S. ; Zoutendyk, John A.
Author_Institution :
Sandia National Laboratories Division 2115, P. O. Box 5800 Albuquerque, NM 87185
Abstract :
Tests and analysis showed that bipolar chips in the attitude control computer of the Galileo spacecraft would likely cause catastrophic mission failure due to single particle upset. This paper describes the design and testing of CMOS replacements which are speed compatible with the bipolar parts and have upset immunity in excess of the mission requirement (upset LET threshold > 37 MeV/mg/ cm2).
Keywords :
CMOS technology; Flip-flops; Immunity testing; Jupiter; Laboratories; Probes; Propulsion; Single event upset; Space shuttles; Space vehicles;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334086
