DocumentCode :
881522
Title :
On verifying the first-order Markovian assumption for a Rayleigh fading channel model
Author :
Wang, Hong Shen ; Chang, Pao-Chi
Author_Institution :
Media Technol. Corp., Taipei, Taiwan
Volume :
45
Issue :
2
fYear :
1996
fDate :
5/1/1996 12:00:00 AM
Firstpage :
353
Lastpage :
357
Abstract :
The use of received signal-to-noise ratio (SNR) as the side information in communication systems has been widely accepted especially when the channel quality is time varying. On many occasions, this side information is treated as the received SNR of the current channel symbol or that of previous symbols. In particular, the first-order Markov channel provides a mathematically tractable model for time-varying channels and uses only the received SNR of the symbol immediately preceding the current one. With the first-order Markovian assumption, given the information of the symbol immediately preceding the current one, any other previous symbol should be independent of the current one. Although the experimental measurements confirm the usefulness of the first-order Markovian assumption, one may argue that second or higher-order Markov processes should provide a more accurate model. We answer this question by showing that given the information corresponding to the previous symbol, the amount of uncertainty remaining in the current symbol should be negligible
Keywords :
Markov processes; Rayleigh channels; fading; time-varying channels; Rayleigh fading channel model; channel symbol; communication systems; experimental measurements; first-order Markov channel; first-order Markovian assumption; higher-order Markov process; received SNR; received signal-to-noise ratio; second order Markov process; side information; time-varying channels; uncertainty; Cities and towns; Degradation; Delay; Fading; Markov processes; Memoryless systems; Mutual information; Signal to noise ratio; Time varying systems; Time-varying channels;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/25.492909
Filename :
492909
Link To Document :
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