Title :
Use of CF-252 to Determine Parameters for SEU Rate Calculation
Author :
Blandford, J.T., Jr. ; Pickel, J.C.
Author_Institution :
IRT Corporation 101 S. Kraemer, Suite 132 Placentia, CA 92670
Abstract :
A Cf-252 irradiation facility for single event testing of microcircuits has been developed. Testing techniques have been refined to include the capability of determining LET thresholds as well as event cross-sections. The capabilities and limitations of Cf-252 in testing to provide parameters for calculation of SEU rate in the heavy ion environment of space are discussed.
Keywords :
Costs; Degradation; Discrete event simulation; Electronic equipment testing; Fixtures; Ion sources; Neutrons; Resistors; Single event upset; Test facilities;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1985.4334109
