DocumentCode :
88189
Title :
SiC Integrated Circuit Control Electronics for High-Temperature Operation
Author :
Alexandru, Mihaela ; Banu, Viorel ; Jorda, Xavier ; Montserrat, Josep ; Vellvehi, Miquel ; Tournier, Dominique ; Millan, Jose ; Godignon, Philippe
Author_Institution :
IMB-CNM Barcelona, Barcelona, Spain
Volume :
62
Issue :
5
fYear :
2015
fDate :
May-15
Firstpage :
3182
Lastpage :
3191
Abstract :
This paper is an important step toward the development of complex integrated circuit (IC) control electronics that have to attend to high-temperature environment power applications. We present in premiere a prototype set of essential mixed-signal ICs on SiC capable of controlling power switches and a lateral power MESFET able to operate at high temperatures, all embedded on the same chip. Also, we report for the first time the functionality of standard Si-CMOS topologies on SiC for the master-slave data flip-flop (FF) and data-reset FF digital building blocks designed with MESFETs. Concretely, we present the complete development of SiC-MESFET IC circuitry, able to integrate gate drivers for SiC power devices. This development is based on the mature and stable Tungsten-Schottky interface technology used for the fabrication of stable SiC Schottky diodes for the European Space Agency Mission BepiColombo.
Keywords :
CMOS integrated circuits; Schottky diodes; flip-flops; high-temperature electronics; mixed analogue-digital integrated circuits; power MESFET; silicon compounds; wide band gap semiconductors; CMOS topology; European space agency mission bepicolombo; Schottky diode; SiC; Tungsten-Schottky interface technology; data-reset FF digital building block; gate driver; high-temperature operation; integrated circuit control electronics; master-slave data flip-flop; mixed-signal IC; power MESFET; power switch; silicon carbide power device; Clocks; Epitaxial growth; Logic gates; MESFETs; Resistors; Silicon carbide; Digital ICs; Digital integrated circuits (ICs); Driver; High Density; High Power; High Temperature; Integrated Circuits; MESFET; Mixed signal; SiC; Voltage reference; driver; high density; high power; high temperature; integrated circuits; mixed signal; silicon carbide (SiC); voltage reference;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2014.2379212
Filename :
6982217
Link To Document :
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