• DocumentCode
    882010
  • Title

    Bias and temperature dependence of Sb-based heterostructure millimeter-wave detectors with improved sensitivity

  • Author

    Meyers, R.G. ; Fay, P. ; Schulman, J.N. ; Thomas, S., III ; Chow, D.H. ; Zinck, J. ; Boegeman, Y.K. ; Deelman, P.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, IN, USA
  • Volume
    25
  • Issue
    1
  • fYear
    2004
  • Firstpage
    4
  • Lastpage
    6
  • Abstract
    Nearly lattice-matched InAs/AlSb/GaSb-based heterostructure backward diodes for zero-bias millimeter wave detection were fabricated and measured. A record-high curvature, /spl gamma/=39.1 V/sup -1/, at zero bias was measured. On-wafer sensitivity measurements from 1 to 110 GHz gave a record-high average sensitivity of 3687 V/W for zero-bias operation. Further enhancement of detector sensitivity was observed with applied dc bias, with a sensitivity of 7996 V/W obtained for a 0.9 μA bias. Extrapolating the conjugately-matched measured sensitivity suggests that 1000 V/W should be achievable at a record-high 541 GHz. The temperature dependence of detector sensitivity was evaluated from measured dc current-voltage characteristics and gave expected sensitivities ranging from 3910 V/W at 293 K to 7740 V/W at 4.2 K.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; millimetre wave detectors; semiconductor diodes; semiconductor heterojunctions; 1 to 110 GHz; 293 K; 4.2 K; InAs-AlSb-GaSb; backward diodes; bias dependence; conjugately-matched measured sensitivity; dc bias; dc current-voltage characteristics; detector sensitivity; millimeter-wave detectors; nearly lattice-matched heterostructure; on-wafer sensitivity measurements; temperature dependence; tin-based heterostructure; zero-bias millimeter wave detection; zero-bias operation; Anodes; Bandwidth; Cathodes; Current measurement; Detectors; Millimeter wave circuits; Millimeter wave measurements; Semiconductor diodes; Signal to noise ratio; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2003.821601
  • Filename
    1264096