Title :
Hazards in Pulse Sequential Circuits
Author_Institution :
Lincoln Lab., Mass. Inst. Tech., Lexington, Mass.
fDate :
4/1/1964 12:00:00 AM
Keywords :
Feeds; Hazards; Network synthesis; Pulse circuits; Sequential circuits; Testing;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1964.263785
