DocumentCode :
882634
Title :
Automatic display of C-V curves for metal-insulator-semiconductor (MIS) structures
Author :
Zaininger, K.H.
Volume :
54
Issue :
7
fYear :
1966
fDate :
7/1/1966 12:00:00 AM
Firstpage :
1001
Lastpage :
1002
Keywords :
Capacitance measurement; Capacitance-voltage characteristics; Current measurement; Density measurement; Displays; Equations; Insulation; Metal-insulator structures; Signal synthesis; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.4966
Filename :
1446896
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=882634
