Title :
A 2.0-μm pixel pitch MOS image sensor with 1.5 transistor/pixel and an amorphous Si color filter
Author :
Kasano, Masahiro ; Inaba, Yuichi ; Mori, Mitsuyoshi ; Kasuga, Shigetaka ; Murata, Takahiko ; Yamaguchi, Takumi
Author_Institution :
Semicond. Devices Res. Center, Semicond. Co., Kyoto, Japan
fDate :
4/1/2006 12:00:00 AM
Abstract :
In this paper, an ultrafine pixel size (2.0×2.0 μm2) MOS image sensor with very high sensitivity is developed. The key technologies that realize the MOS image sensor are a newly developed pixel circuit configuration (1.5 transistor/pixel), a fine 0.15-μm design rule, and an amorphous Si color filter (Si-CF). In the new pixel circuit configuration, a unit pixel consists of one photodiode, one transfer transistor, and an amplifier circuit with two transistors that are shared by four neighboring pixels. Thus, the unit pixel has only 1.5 transistors. The fine design rule of 0.15 μm enables reduction of wiring area by 40%. As a result, a high aperture ratio of 30% is achieved. A newly developed Si-CF realizes the 1/10 thickness of that of the conventional organic-pigment CF, giving rise to high light-collection efficiency. With these three technologies combined, a high sensitivity of 3400 electrons/lx·s is achieved even with a pixel size of 2.0×2.0 μm2.
Keywords :
CMOS image sensors; elemental semiconductors; optical filters; photodiodes; silicon; 0.15 micron; 2.0 micron; MOS image sensor; Si; amorphous silicon color filter; amplifier circuit; aperture ratio; light-collection efficiency; organic-pigment CF; photodiodes; pixel circuit configuration; transfer transistor; ultrafine pixel size image sensor; Amorphous materials; Apertures; Circuits; Electrons; Filters; Image sensors; MOSFETs; Photodiodes; Pixel; Wiring; Amorphous silicon; MOS image sensor; color filter (CF); design rule; pixel configuration; sensitivity;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2006.870286