• DocumentCode
    883229
  • Title

    CMOS device noise considerations for terabit lightwave systems

  • Author

    Dronavalli, Smitha ; Jindal, Renuka P.

  • Author_Institution
    W. H. Hall, Univ. of Louisiana, Lafayette, LA, USA
  • Volume
    53
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    623
  • Lastpage
    630
  • Abstract
    An improved model to predict sensitivity of p-i-n lightwave receivers using CMOS technology is proposed. This model incorporates the latest understanding of excess channel noise observed in nanoscale MOSFETs. For the case of an ideal channel filter, the results are presented in an analytical closed form. For nonideal channels, the concept of higher order Personick integrals is introduced. Up to 10 Gb/s, the results predicted by the above model closely mimic the existing CMOS data published over the last 20 years. Above 10 Gb/s, due to lack of CMOS data, projections are evaluated against the nonsilicon technologies. The predictions compare very favorably with the measured system performance using high electron mobility transistors and heterojunction bipolar transistors. The findings thus indicate that CMOS should claim its status as the low-cost high-performance highly integrated technology of choice for lightwave applications beyond 10 Gb/s.
  • Keywords
    MOSFET; optical receivers; p-i-n photodiodes; semiconductor device models; semiconductor device noise; CMOS device noise; CMOS technology; Personick integrals; channel filter; channel noise; heterojunction bipolar transistors; hightron mobility transistors; nanoscale MOSFET; p-i-n lightwave receivers; terabit lightwave systems; CMOS technology; Filters; HEMTs; Heterojunction bipolar transistors; MODFETs; MOSFETs; PIN photodiodes; Predictive models; Semiconductor device modeling; System performance; CMOS noise; lightwave receivers; nanoscale MOSFETs; personick integrals;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2006.870570
  • Filename
    1610888