DocumentCode
883278
Title
Gate leakage currents in MOS field-effect transistors
Author
Kennedy, Edward J.
Volume
54
Issue
8
fYear
1966
Firstpage
1098
Lastpage
1099
Keywords
Current measurement; Detectors; Dielectric measurements; FETs; Leak detection; Leakage current; MOSFETs; Optical receivers; Temperature; Thermal resistance;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1966.5023
Filename
1446953
Link To Document