• DocumentCode
    885029
  • Title

    A novel multibridge-channel MOSFET (MBCFET): fabrication technologies and characteristics

  • Author

    Lee, Sung-Young ; Kim, Sung-Min ; Yoon, Eun-Jung ; Oh, Chang-Woo ; Chung, Ilsub ; Park, Donggun ; Kim, Kinam

  • Author_Institution
    Samsung Electron. Co., Kyungki-Do, South Korea
  • Volume
    2
  • Issue
    4
  • fYear
    2003
  • Firstpage
    253
  • Lastpage
    257
  • Abstract
    We have demonstrated a novel three-dimensional multibridge-channel metal-oxide-semiconductor field-effect transistor (MBCFET). This transistor was successfully fabricated using a conventional complementary metal-oxide-semiconductor process. We introduce the fabrication technologies and electrical characteristics of MBCFET in comparison with a conventional planar MOSFET. The MBCFET has more benefits than a conventional MOSFET. It shows 4.6 times larger current drivability than a planar MOSFET. This is due to the vertically stacked multibridge channels. The subthreshold swing of MBCFET is 61 mV/dec, which is almost an ideal value due to the thin body surrounded by gate. Based on a simulation result, we show that the MBCFET will have a large on-off state current ratio at short channel transistors.
  • Keywords
    CMOS integrated circuits; MOSFET; complementary metal-oxide-semiconductor process; fabrication technologies; multibridge-channel MOSFET; on-off state current ratio; short channel transistors; subthreshold swing; vertically stacked multibridge channels; CMOS process; Double-gate FETs; Epitaxial growth; Epitaxial layers; Fabrication; Leakage current; MOSFET circuits; Silicon germanium; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2003.820777
  • Filename
    1264877