DocumentCode :
885146
Title :
Current instability above the Gunn threshold
Author :
Shaw, M.P.
Volume :
54
Issue :
11
fYear :
1966
Firstpage :
1580
Lastpage :
1581
Keywords :
Circuit testing; Electrons; Gallium arsenide; Gunn devices; Physics; RLC circuits; Resonant frequency; Temperature distribution; Threshold voltage; Time frequency analysis;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.5198
Filename :
1447128
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=885146
