Spacecraft Hardness Assurance Programs

This paper describes hardness assurance experience gained from several programs including the production of DSCS (Defense Satellite Communications System) III spacecraft. The data and conclusions are applicable to both natural space and nuclear radiation environments. The hardness assurance programs included semiconductor lot sample tests and latchup screening of integrated circuits. The lot sample testing included both displacement and ionization damage induced by reactor and Cobalt-60 sources, respectively, and prompt dose burnout using flash x-ray (FXR) exposure. Test results and resolution of failed lots are discussed. Significant observations and issues for future technology studies are presented.