• DocumentCode
    886649
  • Title

    Aperture admittance measurements

  • Author

    Adams, A.T.

  • Author_Institution
    Syracuse University, Syracuse, N. Y.
  • Volume
    54
  • Issue
    12
  • fYear
    1966
  • Firstpage
    2002
  • Lastpage
    2003
  • Keywords
    Admittance measurement; Apertures; Dielectric measurements; Electric variables measurement; Gallium arsenide; Gunn devices; Length measurement; Reflection; Shunt (electrical);
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1966.5335
  • Filename
    1447265