DocumentCode :
886649
Title :
Aperture admittance measurements
Author :
Adams, A.T.
Author_Institution :
Syracuse University, Syracuse, N. Y.
Volume :
54
Issue :
12
fYear :
1966
Firstpage :
2002
Lastpage :
2003
Keywords :
Admittance measurement; Apertures; Dielectric measurements; Electric variables measurement; Gallium arsenide; Gunn devices; Length measurement; Reflection; Shunt (electrical);
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.5335
Filename :
1447265
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=886649
