DocumentCode :
886654
Title :
A model-based approach to sequential fault diagnosis - A best student paper award winner at IEEE Autotestcon 2005
Author :
Pietersma, J. ; van Gemund, Arjan J. C. ; Bos, A.
Volume :
10
Issue :
2
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
46
Lastpage :
52
Abstract :
Fault diagnosis is crucial for the reduction of test and integration time as well as downtime of complex systems. In this article, we present a model-based approach to derive tests and test sequences for sequential fault diagnosis. This approach offers advantages over methods that are based on test coverage of explicit fault states, represented in matrix form. Functional models are more easily adapted to design changes and constitute a complete information source for test selection on a given abstraction level. We introduce our approach and implementation with a theoretical example. We demonstrate its practical use in three case studies, and for these cases we obtain cost reductions of up to 59% compared to the matrix-based approach
Keywords :
fault simulation; logic testing; sequential circuits; explicit fault states; matrix form; model-based approach; sequential fault diagnosis; test sequences; Awards;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2007.364961
Filename :
4213134
Link To Document :
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