DocumentCode :
886678
Title :
First failure distributions for simultaneous and sequential parallel systems
Author :
Enns, E.G.
Volume :
54
Issue :
12
fYear :
1966
Firstpage :
2005
Lastpage :
2006
Keywords :
Calibration; Computer aided software engineering; Instruments; Iron; Linearity; Magnetic field measurement; Magnetization; NIST; Remanence; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.5338
Filename :
1447268
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=886678
