DocumentCode :
88680
Title :
Experimental and Analytical Performance Evaluation of SiC Power Devices in the Matrix Converter
Author :
Safari, Saeed ; Castellazzi, Alberto ; Wheeler, Pat
Author_Institution :
PEMC Group, Univ. of Nottingham, Nottingham, UK
Volume :
29
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
2584
Lastpage :
2596
Abstract :
With the commercial availability of SiC power devices, their acceptance is expected to grow in consideration of the excellent low switching loss, high-temperature operation, and high-voltage rating capabilities of these devices. This paper presents the comparative performance evaluation of different SiC power devices in the matrix converter at various temperatures and switching frequencies. To this end, first, gate or base drive circuits for normally-off SiC JFET, SiC MOSFET, and SiC BJT by taking into account the special demands for these devices are presented. Then, four two-phase to one-phase matrix converters are built with different Si and SiC power devices to measure the switching waveforms and power losses for them at different temperatures and switching frequencies. Based on the measured data, four different SiC and Si power devices are compared in terms of switching times, conduction and switching losses, and efficiency at different temperatures and switching frequencies. Furthermore, a theoretical investigation of the power losses of the three-phase matrix converter with normally-off SiC JFET, SiC MOSFET, SiC BJT, and Si IGBT is described. The power losses estimation indicates that a 7-kW matrix converter would potentially have an efficiency of approximately 94% in high switching frequency if equipped with SiC devices.
Keywords :
JFET circuits; MOSFET circuits; bipolar transistors; field effect transistor switches; insulated gate bipolar transistors; matrix convertors; power semiconductor switches; silicon compounds; switching convertors; wide band gap semiconductors; BJT; IGBT; JFET; MOSFET; SiC; high temperature operation; high voltage rating; matrix converter; power device; power loss; switching frequency; switching loss; switching waveform; JFETs; Logic gates; MOSFET; Matrix converters; Silicon; Silicon carbide; Switches; Matrix converter; SiC BJT; SiC MOSFET; normally-off SiC JFET; power losses evaluation;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2013.2289746
Filename :
6658954
Link To Document :
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