• DocumentCode
    887113
  • Title

    On-Orbit Observations of Single Event Upset in Harris HM-6508 1K RAMS

  • Author

    Blake, J.B. ; Mandel, R.

  • Author_Institution
    Space Sciences Laboratory the Aerospace Corporation
  • Volume
    33
  • Issue
    6
  • fYear
    1986
  • Firstpage
    1616
  • Lastpage
    1619
  • Abstract
    The SEU and latchup rate of a satellite subsystem containing 384 Harris HM-6508 RAMs was observed over a 2 year period. The satellite was in a low polar orbit. A total of 47 single SEUs, 9 double, 1 triple and 1 quadruple events were observed; the multiple events were 19% of the total. No latchup was observed. The error rate was 7.6 × 10-2 SEUs/chip-year and an upper limit was found of the ratio of latchups/SEUs of 1.7 × 10-2. The observed SEU rate was consistent with predictions based upon laboratory test, using the Lawrence Berkeley Laboratory 88" cyclotron.
  • Keywords
    Cyclotrons; Error analysis; Laboratories; Microelectronics; Missiles; Random access memory; Satellites; Single event upset; Space vehicles; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1986.4334651
  • Filename
    4334651