Title :
The Use of Cf-252 to Measure Latchup Cross Sections as a Function of LET
Author_Institution :
Hughes Aircraft Co., P. O. Box 902, El Segundo, CA 90245
Abstract :
Latchup cross-section measurements of HM6504, HM6641, HD6434, and HM6516, all CMOS devices were performed at various values of LET near threshold by adjusting the air pressure between the source and device. The energies of representative light and heavy fission fragments at the device were determined using an analytical approach which was considered preferable to spectrum measurements if the pulse-height defect in a silicon detector is unusually large.
Keywords :
Absorption; Aircraft; Atomic measurements; Energy measurement; Extraterrestrial measurements; Particle measurements; Performance evaluation; Pressure measurement; Pulse measurements; Silicon;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4334656
