DocumentCode
887155
Title
The Use of Cf-252 to Measure Latchup Cross Sections as a Function of LET
Author
Reier, Melvin
Author_Institution
Hughes Aircraft Co., P. O. Box 902, El Segundo, CA 90245
Volume
33
Issue
6
fYear
1986
Firstpage
1642
Lastpage
1645
Abstract
Latchup cross-section measurements of HM6504, HM6641, HD6434, and HM6516, all CMOS devices were performed at various values of LET near threshold by adjusting the air pressure between the source and device. The energies of representative light and heavy fission fragments at the device were determined using an analytical approach which was considered preferable to spectrum measurements if the pulse-height defect in a silicon detector is unusually large.
Keywords
Absorption; Aircraft; Atomic measurements; Energy measurement; Extraterrestrial measurements; Particle measurements; Performance evaluation; Pressure measurement; Pulse measurements; Silicon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1986.4334656
Filename
4334656
Link To Document