Title :
Computer-aided design for integrated circuits: trying to bridge the gap
fDate :
6/1/1979 12:00:00 AM
Abstract :
CAD performance in the field of simulation, testing, and layout is compared to the increase of digital integrated systems complexity. This complexity already exceeds the fundamental limits of existing software, especially in the testing area. On the other hand, fully manual layout of VLSI leads to unreasonably long design times and extremely high risks. This will favor design automation methods in layout. Testability and layout will most likely impose some sacrifice of VLSI overcapacity to a more structured system architecture. This architecture will lead to testable dedicated VLSI system design through the use of automated design software to keep development costs low.
Keywords :
Circuit layout CAD; Digital integrated circuits; Integrated circuit testing; Large scale integration; circuit layout CAD; digital integrated circuits; integrated circuit testing; large scale integration; Automatic testing; Bridge circuits; Circuit simulation; Circuit testing; Computational modeling; Design automation; Software design; Software testing; System testing; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1979.1051225