DocumentCode :
887886
Title :
ITC 2005 panels
Author :
Stolicny, Carol
Author_Institution :
Intel
Volume :
23
Issue :
2
fYear :
2006
Firstpage :
164
Lastpage :
166
Abstract :
Summaries of panel sessions from the 2005 International Test Conference.
Keywords :
ITC 2005; International Test Conference; design for testability; multicore testing; soft errors; test compression; Costs; Design for testability; Europe; Graphics; Instruments; Multicore processing; Outsourcing; Personnel; Protection; Testing; ITC 2005; International Test Conference; design for testability; multicore testing; soft errors; test compression;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2006.45
Filename :
1613802
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=887886
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