DocumentCode :
887887
Title :
High-resolution A/D conversion in MOS/LSI
Author :
Fotouhi, Bahram ; Hodges, David A.
Volume :
14
Issue :
6
fYear :
1979
fDate :
12/1/1979 12:00:00 AM
Firstpage :
920
Lastpage :
926
Abstract :
A new successive approximation analog-to-digital conversion technique compatible with most MOS process technologies is described. This technique combines a string of equal value diffused resistors and a binary ratioed capacitor array in a unique circuit configuration so that 12-bit monotonicity is achieved with only 8-bit ratio-accurate circuit elements. The comparator is realized by a chopper-stabilized amplifier to reduce the inherently high input offset voltages of MOS amplifiers. Typical performance characteristics taken from a sample of ICs are presented; 12-bit monotonic conversion with differential nonlinearity less than 1/2 LSB is completed in 50 μs. The die area, less logic, is 12000 mil/SUP 2/. Because of assured 12-bit monotonicity, this converter should find applications of closed-loop control systems. It seems feasible to extend this technique to 14-bit resolution for use in applications such as digital audio systems.
Keywords :
Analogue-digital conversion; Field effect integrated circuits; Large scale integration; analogue-digital conversion; field effect integrated circuits; large scale integration; Analog-digital conversion; Audio systems; Control systems; Integrated circuit yield; Large scale integration; MOS capacitors; Monolithic integrated circuits; Resistors; Transfer functions; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1979.1051298
Filename :
1051298
Link To Document :
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