Abstract :
The current copier cell is a versatile building block increasingly used in many analogue CMOS circuits. However, charge injection, noise, Early effect and leakage current affect its accuracy. The Letter focuses on charge injection. A new model, derived from the work of Vittoz (1985) and Sheu et al. (1987), is presented to predict the actual partition of the injected charges. The results are compared with experimental measurements on a test circuit.
Keywords :
CMOS integrated circuits; equivalent circuits; feedback; integrated circuit testing; linear integrated circuits; lumped parameter networks; Early effect; analogue CMOS circuits; charge injection; copier transistor feedback effect; current copier cells; equivalent circuit; leakage current; lumped model; model; noise; test circuit;
