Title :
Built-in test for complex digital integrated circuits
Author :
Könemann, Bernd ; Zwiehoff, Günther ; Mucha, Joachim
fDate :
6/1/1980 12:00:00 AM
Abstract :
A method for testing the logic function of complex digital integrated circuits is presented. The extra hardware needed is kept minimal by functional conversion of already existing components (e.g., registers). The feasibility of the proposed method is demonstrated by results from both hardware simulation and logic simulation. The method is based on an adapted version of signature analysis, and on circuit partitioning (the structure of VLSI circuits is assumed to be inherently modular).
Keywords :
Digital integrated circuits; Integrated circuit testing; Large scale integration; digital integrated circuits; integrated circuit testing; large scale integration; Built-in self-test; Circuit analysis; Circuit simulation; Circuit testing; Digital integrated circuits; Hardware; Integrated circuit testing; Logic functions; Logic testing; Registers;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1980.1051391
