Title :
On the use of matrix algebra for the description of EPROM failures
Author :
Morandi, C. ; Fantini, F.
fDate :
4/1/1981 12:00:00 AM
Abstract :
A description of EPROM failures based on the use of Boolean matrices and operators is offered. It overcomes a number of problems which made previously available theories inapplicable to practical devices, and provides a useful tool for the analysis of test pattern efficiency.
Keywords :
Boolean algebra; Failure analysis; Integrated memory circuits; Logic testing; Matrix algebra; PROM; failure analysis; integrated memory circuits; logic testing; matrix algebra; Circuit faults; Decoding; EPROM; Failure analysis; MOSFET circuits; Matrices; Read only memory; Solid state circuits; Testing; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1981.1051551
