DocumentCode :
890545
Title :
Understanding Coulomb Effects in Nanoscale Schottky-Barrier-FETs
Author :
Indlekofer, Klaus Michael ; Knoch, Joachim ; Appenzeller, Joerg
Author_Institution :
Center of Nanoelectronic Syst. for Inf., Res. Centre Julich GmbH
Volume :
54
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
1502
Lastpage :
1509
Abstract :
We employ a novel multiconfigurational self-consistent Green´s function approach (MCSCG) for the simulation of nanoscale Schottky-barrier-field-effect transistors (SB-FETs). This approach allows the calculation of electronic transport with a seamless transition from the single-electron regime to room-temperature FET operation. The particular improvement of the MCSCG stems from a self-consistent division of the channel system into a small subsystem of resonantly trapped states for which a many-body Fock space approach becomes numerically feasible and the rest of the system which can be treated adequately on a conventional mean-field level. The Fock space description allows for the calculation of few-electron Coulomb charging effects beyond the mean-field. We compare a conventional Hartree nonequilibrium Green´s function calculation with the results of the MCSCG approach. Using the MCSCG method, Coulomb blockade effects are demonstrated at low temperatures while, under strong nonequilibrium and high-temperature conditions, the Hartree approximation is retained. Finally, the visibility of quantum and single-electron effects in scaled transistor structures is discussed
Keywords :
Coulomb blockade; Green´s function methods; Poisson equation; SCF calculations; Schottky barriers; Schottky gate field effect transistors; nanowires; semiconductor device models; Coulomb blockade effects; Coulomb charging effects; Coulomb effects; Coulomb interaction; Hartree approximation; electronic transport; many-body Fock space approach; multiconfigurational self-consistent Green function; nanoscale Schottky-barrier-field-effect transistors; quantum effect; room-temperature operation; scaled transistor structures; seamless transition; single-electron effects; single-electron regime; trapped states; Electron traps; Equations; FETs; Hilbert space; Information technology; Linear discriminant analysis; Resonance; Single electron transistors; Space charge; Temperature; Coulomb interaction; Schottky-barrier-field-effect transistors (SB-FETs); nanowire;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.895235
Filename :
4215180
Link To Document :
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