DocumentCode
890865
Title
Transient simulation of AlGaAs/GaAs/AlGaAs and AlGaAs/InGaAs/AlGaAs hot-electron transistors
Author
Kuzuhara, Masaaki ; Kim, K. ; Hess, Karl
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
36
Issue
1
fYear
1989
fDate
1/1/1989 12:00:00 AM
Firstpage
118
Lastpage
123
Abstract
The intrinsic switching characteristics of tunneling hot electron transfer amplifier (THETA) devices has been simulated using a time-dependent ensemble Monte Carlo method. Results which show that there is no significant difference between the switch-on and switch-off times of THETA devices and that these switching times are always larger than the average total transit time through the base and the collector barrier are presented. The choice of the base width is important to determine the base transport factor, but it is not a direct measure of the intrinsic switching speed. The importance of velocity overshoot in the collector barrier region for ultra-high-speed device operation is demonstrated. An improved device structure that leads to subpicosecond switching speeds in the THETA structures is proposed
Keywords
III-V semiconductors; Monte Carlo methods; aluminium compounds; bipolar transistors; gallium arsenide; hot electron transistors; indium compounds; semiconductor device models; AlGaAs-GaAs-AlGaAs; AlGaAs-InGaAs-AlGaAs; THETA; base transport factor; base width; collector barrier region; hot-electron transistors; intrinsic switching characteristics; switch-off times; switch-on time; time-dependent ensemble Monte Carlo method; total transit time; tunneling hot electron transfer amplifier; ultra-high-speed device operation; velocity overshoot; Application software; Electrons; Gallium arsenide; Indium gallium arsenide; Laboratories; Military computing; National electric code; Tunneling; Velocity measurement; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.21190
Filename
21190
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