• DocumentCode
    890865
  • Title

    Transient simulation of AlGaAs/GaAs/AlGaAs and AlGaAs/InGaAs/AlGaAs hot-electron transistors

  • Author

    Kuzuhara, Masaaki ; Kim, K. ; Hess, Karl

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    36
  • Issue
    1
  • fYear
    1989
  • fDate
    1/1/1989 12:00:00 AM
  • Firstpage
    118
  • Lastpage
    123
  • Abstract
    The intrinsic switching characteristics of tunneling hot electron transfer amplifier (THETA) devices has been simulated using a time-dependent ensemble Monte Carlo method. Results which show that there is no significant difference between the switch-on and switch-off times of THETA devices and that these switching times are always larger than the average total transit time through the base and the collector barrier are presented. The choice of the base width is important to determine the base transport factor, but it is not a direct measure of the intrinsic switching speed. The importance of velocity overshoot in the collector barrier region for ultra-high-speed device operation is demonstrated. An improved device structure that leads to subpicosecond switching speeds in the THETA structures is proposed
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; bipolar transistors; gallium arsenide; hot electron transistors; indium compounds; semiconductor device models; AlGaAs-GaAs-AlGaAs; AlGaAs-InGaAs-AlGaAs; THETA; base transport factor; base width; collector barrier region; hot-electron transistors; intrinsic switching characteristics; switch-off times; switch-on time; time-dependent ensemble Monte Carlo method; total transit time; tunneling hot electron transfer amplifier; ultra-high-speed device operation; velocity overshoot; Application software; Electrons; Gallium arsenide; Indium gallium arsenide; Laboratories; Military computing; National electric code; Tunneling; Velocity measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.21190
  • Filename
    21190