Title :
High voltage distribution measurements using different sphere gaps
fDate :
7/1/1967 12:00:00 AM
Abstract :
A curve was deduced giving the maximum sphere gap against the sphere diameter so that the corresponding discharge potential will not depend on the positions of the spheres. The distortion effect in the original field was eliminated by extrapolating the results obtained to the case of a testing sphere of zero diameter.
Keywords :
Circuits; Collision mitigation; Materials testing; Mercury (metals); Semiconductor device testing; Semiconductor diodes; Semiconductor materials; System testing; Temperature; Voltage measurement;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1967.5811
