Title :
A Design Procedure for Radiation Hardening Certain NOR Gate Logic Circuits
Author :
Maurer, Harold E.
Author_Institution :
Guidance Laboratory, NASA Electronics Research Center, Cambridge, Mass.
Keywords :
Clustering algorithms; Covariance matrix; Euclidean distance; Logic circuits; Pattern classification; Pattern recognition; Piecewise linear approximation; Piecewise linear techniques; Prototypes; Radiation hardening;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1967.264684
