• DocumentCode
    891569
  • Title

    Protection of semiconductor devices, circuits, and equipment from voltage transients

  • Author

    Reich, Bernard

  • Author_Institution
    U.S. Army Electronics Command, Fort Monmouth, N.J.
  • Volume
    55
  • Issue
    8
  • fYear
    1967
  • Firstpage
    1355
  • Lastpage
    1361
  • Abstract
    In this paper a survey is presented of the means that can be applied to the suppression of voltage transients that can affect the reliability of equipment and systems employing semiconductor devices. Consideration is given to some of the ways transients are generated, their duration and magnitudes, and the approach taken in the military standard MIL-STD-704 in confining the power supply characteristics within definite limits which must be tolerated by the utilization equipment. Emphasis is placed on the various techniques--their advantages and limitations--that can be applied in suppressing transients generated from 28-volt dc power supplies. In addition, various device approaches used to limit voltage transients to rectifier diodes are also presented.
  • Keywords
    Character generation; Circuits; Military standards; Power generation; Power supplies; Power system reliability; Protection; Semiconductor device reliability; Semiconductor devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.5835
  • Filename
    1447765