DocumentCode
891603
Title
The saturation characteristics of high-voltage transisitors
Author
Hahn, Larry A.
Author_Institution
Texas Instruments Incorporated, Dallas, Tex.
Volume
55
Issue
8
fYear
1967
Firstpage
1384
Lastpage
1388
Abstract
It is shown that the saturation characteristic of high-voltage NPvN transistors can only be explained by a lowering of the v-layer resistance due to conductivity modulation. A semi-quantitative model is developed which explains this modified saturation region. An experimental method of isolating the resistive portion of the external collector-base (CB) voltage is presented. The results verify that the CB junction may be forward-biased even when the characteristic seemingly indicates that the transistor is unsaturated. Data is also presented showing how variations in collector resistivity and thickness alter the saturation region.
Keywords
Breakdown voltage; Conductivity; Current density; Instruments; Low voltage; Power transistors; Proximity effect; Semiconductor diodes; Switches;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1967.5839
Filename
1447769
Link To Document