• DocumentCode
    891603
  • Title

    The saturation characteristics of high-voltage transisitors

  • Author

    Hahn, Larry A.

  • Author_Institution
    Texas Instruments Incorporated, Dallas, Tex.
  • Volume
    55
  • Issue
    8
  • fYear
    1967
  • Firstpage
    1384
  • Lastpage
    1388
  • Abstract
    It is shown that the saturation characteristic of high-voltage NPvN transistors can only be explained by a lowering of the v-layer resistance due to conductivity modulation. A semi-quantitative model is developed which explains this modified saturation region. An experimental method of isolating the resistive portion of the external collector-base (CB) voltage is presented. The results verify that the CB junction may be forward-biased even when the characteristic seemingly indicates that the transistor is unsaturated. Data is also presented showing how variations in collector resistivity and thickness alter the saturation region.
  • Keywords
    Breakdown voltage; Conductivity; Current density; Instruments; Low voltage; Power transistors; Proximity effect; Semiconductor diodes; Switches;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.5839
  • Filename
    1447769