• DocumentCode
    892889
  • Title

    Propagation delay times of ISL and STL

  • Author

    Lohstroh, Jan ; Pluta, René M.

  • Volume
    17
  • Issue
    4
  • fYear
    1982
  • fDate
    8/1/1982 12:00:00 AM
  • Firstpage
    687
  • Lastpage
    695
  • Abstract
    Propagation delay times of high-speed VLSI candidates ISL and STL are calculated analytically. It is shown by calculations and measurements that STL is marginally faster than ISL in oxide-isolated processes, at the cost of higher process complexity. Both logic forms suffer from speed degradation due to fan-in. Measures to obtain delay times that are independent of fan-in are discussed. Fan-out aspects are also considered. It is shown that ring oscillators exhibit a somewhat better speed than logic gates that start to switch from the DC state. This speed difference is expressed in an empirical formula.
  • Keywords
    Bipolar integrated circuits; Integrated logic circuits; Large scale integration; bipolar integrated circuits; integrated logic circuits; large scale integration; Costs; Current measurement; Electrical resistance measurement; Inverters; Logic arrays; Logic circuits; Propagation delay; Switches; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1982.1051798
  • Filename
    1051798