DocumentCode
893124
Title
A low power resistive load 64 kbit CMOS RAM
Author
Uchida, Yasuo ; Iizuka, Tetsuya ; Isobe, M. ; Konishi, Satoshi ; Sekine, Masakazu ; Ohtani, T. ; Kohyama, S.
Volume
17
Issue
5
fYear
1982
Firstpage
804
Lastpage
809
Abstract
A fully asynchronous 8K word/spl times/8 bit CMOS static RAM with high resistive load cells is described. For fabricating the RAM, an advanced double polysilicon 2 /spl mu/m CMOS technology has been developed. Internally clocked dynamic peripheral circuits with address transition detectors are implemented to achieve high speed and low power simultaneously. A new CMOS fault-tolerant circuit technology is also introduced for improving fabrication yield without sacrificing operating speed or standby power. The resulting cell size and die size are 15/spl times/19 /spl mu/m and 4.87/spl times/7.22 mm, respectively. The RAM offers, typically, 70 ns access time, 15 mW operating power, and 10 /spl mu/W standby power.
Keywords
Field effect integrated circuits; field effect integrated circuits; CMOS memory circuits; CMOS process; CMOS technology; Clocks; Detectors; Fabrication; Fault tolerance; MOS devices; Random access memory; Read-write memory;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1982.1051822
Filename
1051822
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