• DocumentCode
    893267
  • Title

    Completely buried planar waveguides fabricated in glass using a two-step purely thermal K+ and Na+ ion-exchange

  • Author

    Zhou, Y. ; Laybourn, P.J.R. ; Magill, J.V. ; De La Rue, R.M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
  • Volume
    139
  • Issue
    3
  • fYear
    1992
  • fDate
    6/1/1992 12:00:00 AM
  • Firstpage
    223
  • Lastpage
    227
  • Abstract
    The authors have succeeded in fabricating completely buried planar waveguides in glass using a two-step, purely thermal K+- and Na+-exchange. Ion-exchange conditions were experimentally determined, which ensured the complete burial of the waveguide and avoided problems of microcracking in the guiding layer. The refractive index profiles of both surface and buried waveguides were observed using a Mach-Zehnder interference microscope, and these profiles agreed well with theoretical predictions
  • Keywords
    integrated optics; ion exchange; optical glass; optical waveguides; optical workshop techniques; refractive index measurement; K+; Mach-Zehnder interference microscope; Na+; Na+ ion-exchange; buried planar waveguides; guiding layer; in glass planar waveguide fabrication; purely thermal; refractive index profiles; refractometry; two-step;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings J
  • Publisher
    iet
  • ISSN
    0267-3932
  • Type

    jour

  • Filename
    144794
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=893267