DocumentCode
893737
Title
Small area high purity germanium detectors for use in the energy range 100 eV to 100 keV
Author
Cox, C.E. ; Lowe, B.G. ; Sareen, R.A.
Author_Institution
Link Anal. Ltd., High Wycombe, UK
Volume
35
Issue
1
fYear
1988
Firstpage
28
Lastpage
32
Abstract
The performance of small-area high-purity germanium detectors used to detect X-rays in the energy range from 100 eV to 100 keV is discussed. The response at low, medium and high energies, the variation of detector performance with high voltage bias, and radiation hardness are covered. Good spectrum line shapes have been achieved even at ultralow energies. These detectors are intended for X-ray microanalysis in electron microscopes, where they offer the advantages of good high-energy detection efficiency, lower noise, and higher energy resolution compared to the conventional lithium-drifted silicon detector.<>
Keywords
X-ray detection and measurement; semiconductor counters; 100 eV to 100 keV; Ge detector; X-ray microanalysis; X-rays; electron microscopes; high voltage bias; higher energy resolution; lower noise; radiation hardness; small-area high-purity; spectrum line shapes; ultralow energies; Electron microscopy; Energy resolution; Germanium; Noise shaping; Radiation detectors; Shape; Silicon; Voltage; X-ray detection; X-ray detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.12667
Filename
12667
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