• DocumentCode
    893737
  • Title

    Small area high purity germanium detectors for use in the energy range 100 eV to 100 keV

  • Author

    Cox, C.E. ; Lowe, B.G. ; Sareen, R.A.

  • Author_Institution
    Link Anal. Ltd., High Wycombe, UK
  • Volume
    35
  • Issue
    1
  • fYear
    1988
  • Firstpage
    28
  • Lastpage
    32
  • Abstract
    The performance of small-area high-purity germanium detectors used to detect X-rays in the energy range from 100 eV to 100 keV is discussed. The response at low, medium and high energies, the variation of detector performance with high voltage bias, and radiation hardness are covered. Good spectrum line shapes have been achieved even at ultralow energies. These detectors are intended for X-ray microanalysis in electron microscopes, where they offer the advantages of good high-energy detection efficiency, lower noise, and higher energy resolution compared to the conventional lithium-drifted silicon detector.<>
  • Keywords
    X-ray detection and measurement; semiconductor counters; 100 eV to 100 keV; Ge detector; X-ray microanalysis; X-rays; electron microscopes; high voltage bias; higher energy resolution; lower noise; radiation hardness; small-area high-purity; spectrum line shapes; ultralow energies; Electron microscopy; Energy resolution; Germanium; Noise shaping; Radiation detectors; Shape; Silicon; Voltage; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.12667
  • Filename
    12667