Corrections to “Complex-Permittivity Measurement on High- $Q$ Materials via Combined Numerical Approaches”

Author

Fan, X.C. ; Chen, X.M. ; Liu, X.Q.

Volume

Issue

fYear

2006

fDate

6/1/2006 12:00:00 AM

Firstpage

1631

Lastpage

1631

Abstract

Provides an overview of the technical articles and features presented in this issue.

Keywords

Diffraction; Equations; Error correction; Materials science and technology; Microwave measurements; Q measurement; Scattering;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

DOI

10.1109/TMTT.2006.871368

Filename

1618584

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