DocumentCode :
893758
Title :
Corrections to “Complex-Permittivity Measurement on High- 
Materials via Combined Numerical Approaches”
Materials via Combined Numerical Approaches”Author :
Fan, X.C. ; Chen, X.M. ; Liu, X.Q.
Volume :
54
Issue :
4
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
1631
Lastpage :
1631
Abstract :
Provides an overview of the technical articles and features presented in this issue.
Keywords :
Diffraction; Equations; Error correction; Materials science and technology; Microwave measurements; Q measurement; Scattering;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2006.871368
Filename :
1618584
Link To Document :
