• DocumentCode
    894028
  • Title

    All-refractory Josephson logic circuits

  • Author

    Jillie, Don ; Smith, Lawrence N. ; Kroger, Harry ; Currier, Louis W. ; Payer, Robert L. ; Potter, Curtis ; Shaw, Dale M.

  • Volume
    18
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    173
  • Lastpage
    180
  • Abstract
    A process for the fabrication of Josephson integrated circuits is described which uses only refractory materials. The Josephson devices are Nb-Si-Nb tunnel junctions which are formed in the initial phase of the process. After depositing a Nb-Si-Nb `trilayer´ over the entire substrate, the individual devices are isolated by the selective niobium anodization process (SNAP). Other materials used are molybdenum for the normal resistors and bias-sputtered SiO/SUB 2/ for additional insulator layers. The process uses only five photolithographic steps to produce circuits of the direct-coupled isolation type. This simplicity is achieved by using some layers for multiple purposes and by fabricating components with different functional purposes in a single step. For example, the lower electrode of the Josephson devices also functions as the ground plane and the contacts to the ground plane are actually large-area Josephson junctions formed simultaneously with the active devices. Low capacitance junctions (~0.025 pF//spl mu/m/SUP 2/) are produced with good uniformity.
  • Keywords
    Integrated circuit technology; Integrated logic circuits; Josephson effect; Superconducting junction devices; integrated circuit technology; integrated logic circuits; superconducting junction devices; Fabrication; Insulation; Integrated circuit technology; Josephson junctions; Niobium; Reproducibility of results; Resistors; Resists; Robustness; Superconducting devices;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1983.1051919
  • Filename
    1051919