• DocumentCode
    894545
  • Title

    A 64K DRAM with 35 ns static column operation

  • Author

    Baba, Fumio ; Mochizuki, Hirohiko ; Yabu, Takashi ; Shirai, Keigo ; Miyasaka, Kiyoshi

  • Volume
    18
  • Issue
    5
  • fYear
    1983
  • Firstpage
    447
  • Lastpage
    451
  • Abstract
    A 64K dynamic RAM with a function mode similar to static memory operation is described. The device has multiplexed address inputs and a one-address strobe clock (RAS). After a row address is applied to the device, column selection is performed as in static memory, resulting in fast cycle time and simplicity of use. Column address access time and cycle times of 35 ns are achieved. The device has some other functions to reduce critical timings. Address transition detector circuits are used for column selection. An improved column decoder is provided to allow column address input skew. The device uses NMOS single transistor memory cells and is packaged in a standard 300-mil 16-pin DIP.
  • Keywords
    Field effect integrated circuits; Integrated circuit technology; Integrated memory circuits; Large scale integration; Random-access storage; field effect integrated circuits; integrated circuit technology; integrated memory circuits; large scale integration; random-access storage; Circuits; Clocks; Costs; DRAM chips; Decoding; Detectors; Electronics packaging; MOS devices; Random access memory; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1983.1051976
  • Filename
    1051976