Title :
A divided word-line structure in the static RAM and its application to a 64K full CMOS RAM
Author :
Yoshimoto, Masahiko ; Anami, Kenji ; Shinohara, Hirofumi ; Yoshihara, Tsutomu ; Takagi, Hiroshi ; Nagao, Shigeo ; Kayano, Shinpei ; Nakano, Takao
Abstract :
This paper describes a divided word-line (DWL) structure which solves inherent problems encountered in VLSI static RAMs. The key feature is to divide the word-line and to select it hierarchically with little area penalty using conventional process technology. In the application of the DWL structure, an 8K /spl times/ 8 full CMOS RAM has been developed with 2-/spl mu/m double polysilicon technology. The RAM has a typical access time of 60 ns. An operating current of 20 mA was obtained with a simple static design. The six-transistor cell configuration achieved a low standby current of less than 10 nA. For further improvement in speed, the second poly-Si layer was replaced with a polycide (poly-Si + MoSi/SUB 2/) layer, thus providing a 50-ns address access time.
Keywords :
Field effect integrated circuits; Integrated circuit technology; Integrated memory circuits; Large scale integration; Random-access storage; field effect integrated circuits; integrated circuit technology; integrated memory circuits; large scale integration; random-access storage; Batteries; CMOS technology; Circuits; Decoding; Delay effects; MOS devices; Microelectronics; Random access memory; Read-write memory; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1983.1051981