• DocumentCode
    894895
  • Title

    Estimators for Reliability Measures in Geometric Distribution Model Using Dependent Masked System Life Test Data

  • Author

    Sarhan, Ammar M. ; Guess, Frank M. ; Usher, John S.

  • Author_Institution
    Fac. of Sci., Mansoura Univ.
  • Volume
    56
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    312
  • Lastpage
    320
  • Abstract
    Masked system life test data arises when the exact component which causes the system failure is unknown. Instead, it is assumed that there are two observable quantities for each system on the life test. These quantities are the system life time, and the set of components that contains the component leading to the system failure. The component leading to the system failure may be either completely unknown (general masking), isolated to a subset of system components (partial masking), or exactly known (no masking). In the dependent masked system life test data, it is assumed that the probability of masking may depend on the true cause of system failure. Masking is usually due to limited resources for diagnosing the cause of system failures, as well as the modular nature of the system. In this paper, we present point, and interval maximum likelihood, and Bayes estimators for the reliability measures of the individual components in a multi-component system in the presence of dependent masked system life test data. The life time distributions of the system components are assumed to be geometric with different parameters. Simulation study will be given in order to 1) compare the two procedures used to derive the estimators for the reliability measures of system components, 2) study the influence of the masking level on the accuracy of the estimators obtained, and 3) study the influence of the masking probability ratio on the accuracy of the estimators obtained
  • Keywords
    Bayes methods; failure analysis; life testing; maximum likelihood estimation; reliability; statistical distributions; statistical testing; Bayes reliability estimator; dependent masked system; failure diagnosis; geometric distribution model; interval maximum likelihood; life testing; multicomponent system; probability ratio; Bayesian methods; Distribution functions; Life estimation; Life testing; Lifetime estimation; Mathematics; Maximum likelihood estimation; Probability density function; Solid modeling; System testing; Bayes procedure; beta distribution; dependent masked data; geometric distribution; maximum likelihood procedure;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2007.895300
  • Filename
    4220798