DocumentCode
894908
Title
Simulation-Based Bug Trace Minimization With BMC-Based Refinement
Author
Chang, Kai-Hui ; Bertacco, Valeria ; Markov, Igor L.
Author_Institution
Adv. Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI
Volume
26
Issue
1
fYear
2007
Firstpage
152
Lastpage
165
Abstract
Finding the cause of a bug can be one of the most time-consuming activities in design verification. This is particularly true in the case of bugs discovered in the context of a random-simulation-based methodology, where bug traces, or counterexamples, may be several hundred thousand cycles long. In this paper, BUg TRAce MINimization (Butramin), which is a bug trace minimizer, is proposed. Butramin considers a bug trace produced by a random simulator or semiformal verification software and produces an equivalent trace of shorter length. Butramin applies a range of minimization techniques, deploying both simulation-based and formal methods, with the objective of producing highly reduced traces that still expose the original bug. Butramin was evaluated on a range of designs, including the publicly available picoJava microprocessor, and bug traces up to one million cycles long. Experiments show that in most cases, Butramin is able to reduce traces to a very small fraction of their initial sizes, in terms of cycle length and signals involved. The minimized traces can greatly facilitate bug analysis and reduce regression runtime
Keywords
integrated circuit testing; microprocessor chips; regression analysis; Butramin; bug trace minimization; counterexample minimization; error diagnosis; picojava microprocessor; random simulation; regression runtime; semiformal verification software; Analytical models; Computational modeling; Computer bugs; Context modeling; Electronic design automation and methodology; Integrated circuit synthesis; Microprocessors; Minimization methods; Runtime; Testing; Bug trace minimization (Butramin); counterexample minimization; error diagnosis; verification;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2006.882511
Filename
4039508
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