DocumentCode
895121
Title
Measurement of diffusion length and surface recombination velocity in semiconducting solids
Author
Deb, Sujay ; Mukherjee, M.K. ; Dutta, Suparna
Volume
56
Issue
1
fYear
1968
Firstpage
133
Lastpage
134
Abstract
A two-dimensional diffusion theory taking surface recombination into account is utilized for measurement of the diffusion length L in semiconducting solids. Methods for simultaneous measurement of L and surface recombination velocity, and a scheme for further refinement in observation, are also indicated.
Keywords
Charge carrier density; Length measurement; Probes; Pulse measurements; Radiative recombination; Semiconductivity; Solids; Strips; Velocity measurement; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1968.6200
Filename
1448130
Link To Document