• DocumentCode
    895525
  • Title

    Threshold Current for the Onset of Kirk Effect in Bipolar Transistors With a Fully Depleted Nonuniformly Doped Collector

  • Author

    van der Toorn, Ramses

  • Author_Institution
    NXP Res., Eindhoven
  • Volume
    28
  • Issue
    1
  • fYear
    2007
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    We derive a generalized expression for the threshold current of the Kirk effect (base widening) in bipolar transistors that have a fully depleted collector and a nonuniform dopant distribution in the collector. This generalized expression can be helpful to the analysis of the electrical characteristics, such as the cutoff frequency as a function of bias conditions, and hence to the optimization of such devices
  • Keywords
    bipolar transistors; semiconductor doping; Kirk effect; base widening; bipolar transistors; fully depleted nonuniformly doped collector; semiconductor device doping; semiconductor device modeling; threshold current; Bipolar transistors; Cutoff frequency; Electric variables; Genetic expression; Kirk field collapse effect; Neodymium; Semiconductor device doping; Semiconductor device modeling; Threshold current; Threshold voltage; Base widening; Kirk effect; bipolar transistors; doping; semiconductor device doping; semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2006.887936
  • Filename
    4039569