Radiation Response of Integrated Schottky Logic Circuits

The radiation response of Integrated Schottky Logic (ISL) circuits is described. An 8-bit ALU, 4-bit shift register, and 4-bit adder implemented on the Signetics 8A1200 ISL Configurable Gate Array were studied in flash x-ray, neutron, and total dose environments. Experimental data are provided describing the variation of ALU propagation delays and output I-V characteristics with neutron and total dose exposure. Transient gamma upset levels are given for the three circuits studied, and their dependence on ISL logic configuration and bias conditions is described. Mechanisms are proposed to explain the trends exhibited in the experimental results.