DocumentCode :
896047
Title :
GaAs 1 kbit static RAM with self-aligned FET technology
Author :
Asai, Kazuyoshi ; Kurumada, Katsuhiko ; Hirayama, Masahiro ; Ohmori, Masamichi
Volume :
19
Issue :
2
fYear :
1984
fDate :
4/1/1984 12:00:00 AM
Firstpage :
260
Lastpage :
262
Abstract :
A GaAs-1 kbit RAM is demonstrated to realize high-speed switching at the LSI level. The SAINT FET is utilized to eliminate the surface depletion without an increase of excess capacitance. To lower the threshold voltage standard deviation, a one-direction gate arrangement is adopted. A pull-up circuit is also a new addition to the first reported RAM. The resulting RAM performances are 1.5 ns address access time with 369 mW power consumption. The minimum write-enable pulsewidth is less than 2 ns. The maximum number of good bits is 1001 bits/1024 bits. The problems of mass production of GaAs LSI are discussed.
Keywords :
Field effect integrated circuits; field effect integrated circuits; Circuit stability; FETs; Fabrication; Gallium arsenide; Integrated circuit interconnections; Planarization; Read-write memory; Threshold voltage; Transconductance; Voltage control;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1984.1052127
Filename :
1052127
Link To Document :
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