• DocumentCode
    896047
  • Title

    GaAs 1 kbit static RAM with self-aligned FET technology

  • Author

    Asai, Kazuyoshi ; Kurumada, Katsuhiko ; Hirayama, Masahiro ; Ohmori, Masamichi

  • Volume
    19
  • Issue
    2
  • fYear
    1984
  • fDate
    4/1/1984 12:00:00 AM
  • Firstpage
    260
  • Lastpage
    262
  • Abstract
    A GaAs-1 kbit RAM is demonstrated to realize high-speed switching at the LSI level. The SAINT FET is utilized to eliminate the surface depletion without an increase of excess capacitance. To lower the threshold voltage standard deviation, a one-direction gate arrangement is adopted. A pull-up circuit is also a new addition to the first reported RAM. The resulting RAM performances are 1.5 ns address access time with 369 mW power consumption. The minimum write-enable pulsewidth is less than 2 ns. The maximum number of good bits is 1001 bits/1024 bits. The problems of mass production of GaAs LSI are discussed.
  • Keywords
    Field effect integrated circuits; field effect integrated circuits; Circuit stability; FETs; Fabrication; Gallium arsenide; Integrated circuit interconnections; Planarization; Read-write memory; Threshold voltage; Transconductance; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1984.1052127
  • Filename
    1052127