Title :
Predicting Lower Bounds on Failure Power Distributions of Silicon NPN Transistors
Author :
Alexander, David R. ; Enlow, Ed W.
Author_Institution :
Sandia National Laboratories Albuquerque, NM 87185 (505) 844-5163
Keywords :
Diffusion processes; Fabrication; Failure analysis; History; Manufacturing; Power distribution; Semiconductor device manufacture; Semiconductor device testing; Silicon; Topology;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335718
